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features ? single-voltage operation ? 5v read ? 5v reprogramming fast read access time ? 45 ns internal program control and timer sector architecture ? one 16k bytes boot block with programming lockout ? two 8k bytes parameter blocks ? two main memory blocks (32k bytes, 64k bytes) fast erase cycle time ? 3 seconds byte-by-byte programming ? 30 s/byte typical hardware data protection data polling for end of program detection low power dissipation ? 30 ma active current ? 50 a cmos standby current typical 10,000 write cycles green (pb/halide-free) packaging option 1. description the at49f001a(n)(t) is a 5-volt only in-system reprogrammable flash memory. its 1 megabit of memory is organized as 131, 072 words by 8 bits. manufactured with atmel?s advanced nonvolatile cmos technology, the device offers access times to 45 ns with power dissipation of just 165 mw over the industrial temperature range. when the device is deselected, the cmos standby current is less than 50 a. for the at49f001an(t), pin 1 for the plcc package and pin 9 for the tsop package are no connect pins. to allow for simple in-system reprogrammability, the at49f001a(n)(t) does not require high input voltages for programming. five-volt-only commands determine the read and programming operation of the device. reading data out of the device is sim- ilar to reading from an eprom; it has standard ce , oe , and we inputs to avoid bus contention. reprogramming the at49f001a(n)(t) is performed by erasing a block of data and then programming on a byte by byte basis. the byte programming time is a fast 30 s. the end of a program cycle can be optionally detected by the data polling feature. once the end of a byte program cycle has been detected, a new access for a read or program can begin. the typical number of program and erase cycles is in excess of 10,000 cycles. the device is erased by executing the erase command sequence; the device inter- nally controls the erase operations. there are two 8k byte parameter block sections, two main memory blocks, and one boot block. the device has the capability to protect the data in the boot block; this feature is enabled by a command sequence. the 16k-byte boot block section includes a repro- gramming lock out feature to provide data integrity. the boot sector is designed to contain user secure code, and when the feature is enabled, the boot sector is protected from being reprogrammed. 1-megabit (128k x 8) 5-volt only flash memory at49f001a at49f001an at49f001at at49f001ant 3365e?flash?4/05
2 3365e?flash?4/05 at49f001a(n)(t) in the at49f001a(n)(t), once the boot block programming lockout feature is enabled, the con- tents of the boot block are permanent and cannot be changed. in the at49f001a(t), once the boot block programming lockout feature is enabled, the contents of the boot block cannot be changed with input voltage levels of 5.5 volts or less. 2. pin configurations 2.1 32-lead plcc top view 2.2 32-lead vsop (8 x 14 mm) or 32-lead tsop, type 1 (8 x 20 mm) pin name function a0 - a16 addresses ce chip enable oe output enable we write enable reset reset i/o0 - i/o7 data inputs/outputs nc no connect 5 6 7 8 9 10 11 12 13 29 28 27 26 25 24 23 22 21 a7 a6 a5 a4 a3 a2 a1 a0 i/o0 a14 a13 a8 a9 a11 oe a10 ce i/o7 4 3 2 1 32 31 30 14 15 16 17 18 19 20 i/o1 i/o2 gnd i/o3 i/o4 i/o5 i/o6 a12 a15 a16 reset * vcc we nc 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 a11 a9 a8 a13 a14 nc we vcc * reset a16 a15 a12 a7 a6 a5 a4 oe a10 ce i/o7 i/o6 i/o5 i/o4 i/o3 gnd i/o2 i/o1 i/o0 a0 a1 a2 a3
3 3365e?flash?4/05 at49f001a(n)(t) 3. block diagram 4. device operation 4.1 read the at49f001a(n)(t) is accessed like an eprom. when ce and oe are low and we is high, the data stored at the memory location determined by the address pins is asserted on the out- puts. the outputs are put in the high impedance state whenever ce or oe is high. this dual-line control gives designers flexibility in preventing bus contention. 4.2 command sequences when the device is first powered on it will be reset to the read or standby mode depending upon the state of the control line inputs. in order to perform other device func tions, a series of com- mand sequences are entered into the device. the command sequences are shown in the ?command definition table? on page 6 . the command sequences are written by applying a low pulse on the we or ce input with ce or we low (respectively) and oe high. the address is latched on the falling edge of ce or we (except for the sixth cycle of the sector erase com- mand), whichever occurs last. the data is latched by the first rising edge of ce or we . standard microprocessor write timings are used. the address locations used in the command sequences are not affected by entering the command sequences. 4.3 reset a reset input pin is provided to ease some system applications. when reset is at a logic high level, the device is in its standard operating mode. a low level on the reset input halts the present device operation and puts the outputs of the device in a high impedance state. if the reset pin makes a high to low transition during a program or erase operation, the operation may not be successfully completed and the operation will have to be repeated after a high level is applied to the reset pin. when a high level is reasserted on the reset pin, the device returns to the read or standby mode, depending upon the state of the control inputs. by applying a 12v 0.5v input signal to the reset pin, the boot block array can be reprogrammed even if the boot block lockout feature has been enabled (see ?boot block programming lockout? on page 4 ). the reset feature is not available for the at49f001an(t). control logic y decoder parameter block 1 (8k bytes) boot block (16k bytes) oe we ce reset address inputs vcc gnd at49f001a(n)t data inputs/outputs i/o7 - i/o0 8 x decoder parameter block 2 (8k bytes) main memory block 1 (32k bytes) main memory block 2 (64k bytes) program data latches y-gating input/output buffers 1ffff 1c000 1bfff 1a000 19fff 18000 17fff 10000 0ffff 00000 parameter block 1 (8k bytes) boot block (16k bytes) at49f001a(n) data inputs/outputs i/o7 - i/o0 8 parameter block 2 (8k bytes) main memory block 1 (32k bytes) main memory block 2 (64k bytes) program data latches y-gating input/output buffers 1ffff 10000 0ffff 08000 07fff 06000 05fff 04000 03fff 00000
4 3365e?flash?4/05 at49f001a(n)(t) 4.4 erasure before a byte can be reprogrammed, the main memory block or parameter block which contains the byte must be erased. the erased state of the memory bits is a logical ?1?. the entire device can be erased at one time by using a 6-byte software code. the software chip erase code con- sists of 6-byte load commands to specific address locations with a specific data pattern (please refer to the chip erase cycle waveforms). after the software chip erase has been initiated, the device will internally time the erase opera- tion so that no external clocks are required. the maximum time needed to erase the whole chip is t ec . if the boot block lockout feature has been enabled, the data in the boot sector will not be erased. 4.4.1 chip erase if the boot block lockout has been enabled, the chip erase function will erase parameter block 1, parameter block 2, main memory block 1- 2 but not the boot block. if the boot block lockout has not been enabled, the chip erase function will erase the entire chip. after the full chip erase the device will return back to read mode. any command during chip erase will be ignored. 4.4.2 sector erase as an alternative to a full chip erase, the device is organized into sectors that can be individually erased. there are two 8k-byte parameter block sections and two main memory blocks. the 8k- byte parameter block sections and the two main memory blocks can be independently erased and reprogrammed. the sector erase command is a six bus cycle operation. the sector address is latched on the rising we edge of the sixth cycle and the 30h data input command is also latched at the rising edge of we . the sector erase starts after the rising edge of we of the sixth cycle. the erase operation is internally controlled; it will automatically time to completion. 4.5 byte programming once the memory array is erased, the device is programmed (to a logical ?0?) on a byte-by-byte basis. please note that a data ?0? cannot be prog rammed back to a ?1?; only erase operations can convert ?0?s to ?1?s. programming is accomplished via the internal device command register and is a 4 bus cycle operation (please refer to the ?command definition table? on page 6 ). the device will automatically generate the required internal program pulses. the program cycle has addresses latched on the falling edge of we or ce , whichever occurs last, and the data latched on the rising edge of we or ce , whichever occurs first. programming is completed after the specified t bp cycle time. the data polling feature may also be used to indicate the end of a program cycle. 4.6 boot block programming lockout the device has one designated block that has a programming lockout feature. this feature pre- vents programming of data in the designated block once the feature has been enabled. the size of the block is 16k bytes. this block, referred to as the boot block, can contain secure code that is used to bring up the system. enabling the lockout feature will allow the boot code to stay in the device while data in the rest of the device is updated. this feature does not have to be activated; the boot block?s usage as a write protected region is optional to the user. the address range of the boot block is 00000 to 03fff for the at49f001a(n) while the address range of the boot block is 1c000 to 1ffff for the at49f001a(n)t. once the feature is enabled, the data in the boot block can no longer be erased or programmed with input voltage levels of 5.5v or less. data in the main memory block can still be changed
5 3365e?flash?4/05 at49f001a(n)(t) through the regular programming method. to activate the lockout feature, a series of six pro- gram commands to specific addresses with specific data must be performed. please refer to the ?command definition table? on page 6 . 4.6.1 boot block lockout detection a software method is available to determine if programming of the boot block section is locked out. when the device is in the software product identification mode (see software product iden- tification entry and exit sections) a read from address location 00002h will show if programming the boot block is locked out for the at49f001a(n), and a read from address location 1c002h will show if programming the boot block is locked out for the at49f001a(n)t. if the data on i/o0 is low, the boot block can be programmed; if the data on i/o0 is high, the program lockout fea- ture has been activated and the block cannot be programmed. the software product identification exit code should be used to return to standard operation. 4.6.2 boot block programming lockout override the user can override the boot block programming lockout by taking the reset pin to 12 volts. by doing this, protected boot block data can be altered through a chip erase, sector erase or word programming. when the reset pin is brought back to ttl levels the boot block program- ming lockout feature is again active. this feature is not available on the at49f001an(t). 4.7 product identification the product identification mode identifies the device and manufacturer as atmel. it may be accessed by hardware or software operation. the hardware operation mode can be used by an external programmer to identify the correct programming algorithm for the atmel product. for details, see ?operating modes? on page 7 (for hardware operation) or software product identification. the manufacturer and device code is the same for both modes. 4.8 data polling the at49f001a(n)(t) features data polling to indicate the end of a program cycle. during a program cycle an attempted read of the last byte loaded will result in the complement of the loaded data on i/o7. once the program cycle has been completed, true data is valid on all out- puts and the next cycle may begin. data polling may begin at any time during the program cycle. 4.9 toggle bit in addition to data polling the at49f001a(n)(t) provides another method for determining the end of a program or erase cycle. during a program or erase operation, successive attempts to read data from the device will result in i/o6 toggling between one and zero. once the program cycle has completed, i/o6 will stop toggling and valid data will be read. examining the toggle bit may begin at any time during a program cycle. 4.10 hardware data protection hardware features protect against inadvertent programs to the at49f001a(n)(t) in the follow- ing ways: (a) v cc sense: if v cc is below 3.8v (typical), the pr ogram function is inhibited. (b) program inhibit: holding any one of oe low, ce high or we high inhibits program cycles. (c) noise filter: pulses of less than 15 ns (typical) on the we or ce inputs will not initiate a program cycle.
6 3365e?flash?4/05 at49f001a(n)(t) notes: 1. the data format in each bus cycle is as follows: i/o7 - i/o0 (hex). the address format in each bus cycle is as follows: a11 - a0 (hex); a11 - a16 (don?t care). 2. since a11 is don?t care, aaa can be replaced with 2aa. 3. the 16k byte boot sector has the address range 00000h to 03fffh for the at49f001a(n) and 1c000h to 1ffffh for the at 4 9 f 0 0 1 a ( n ) t 4. either one of the product id exit commands can be used. 5. sa = sector addresses: for the at49f001a(n): sa = 00000 to 03fff for boot block sa = 04000 to 05fff for parameter block 1 sa = 06000 to 07fff for parameter block 2 sa = 08000 to ffff for main memory array block 1 sa = 10000 to 1ffff for main memory array block 2 for the at49f001a(n)t: sa = 1c000 to 1ffff for boot block sa = 1a000 to 1bfff for parameter block 1 sa = 18000 to 19fff for parameter block 2 sa = 10000 to 17fff for main memory array block 1 sa = 00000 to 0ffff for main memory array block 2 5. command definition table command sequence bus cycles 1st bus cycle 2nd bus cycle 3rd bus cycle 4th bus cycle 5th bus cycle 6th bus cycle addr data addr data addr data addr data addr data addr data read 1 addr d out chip erase 6 555 aa aaa (2) 55 555 80 555 aa aaa 55 555 10 sector erase 6 555 aa aaa 55 555 80 555 aa aaa 55 sa (5) 30 byte program 4 555 aa aaa 55 555 a0 addr d in boot block lockout (3) 6 555 aa aaa 55 555 80 555 aa aaa 55 555 40 product id entry 3 555 aa aaa 55 555 90 product id exit (4) 3 555 aa aaa 55 555 f0 product id exit (4) 1 xxxx f0 6. absolute maximum ratings* temperature under bias................................ -55c to +125c *notice: stresses beyond those listed under ?absolute maxi- mum ratings? may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these or any other condi- tions beyond those indicated in the operational sec- tions of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. storage temperature ..................................... -65c to +150c all input voltages (including nc pins) with respect to ground ...................................-0.6v to +6.25v all output voltages with respect to ground .............................-0.6v to v cc + 0.6v voltage on oe with respect to ground ...................................-0.6v to +13.5v
7 3365e?flash?4/05 at49f001a(n)(t) notes: 1. x can be v il or v ih. 2. refer to ac programming waveforms. 3. v h = 12.0v 0.5v. 4. manufacturer code: 1fh, device code: 05h ? at49f001a(n), 04h ? at49f001a(n)t. 5. see details under software product identification entry/exit. 6. this pin is not available on the at49f001an(t). note: 1. in the erase mode, i cc is 70 ma. 7. dc and ac operating range at49f001a(n)(t)-45 at49f001a(n)(t)-55 operating temperature (case) ind. -40 c - 85 c-40 c - 85 c v cc power supply 5v 10% 5v 10% 8. operating modes mode ce oe we reset (6) ai i/o read v il v il v ih v ih ai d out program/erase (2) v il v ih v il v ih ai d in standby/write inhibit v ih x (1) xv ih xhigh z program inhibit xxv ih v ih xv il xv ih output disable x v ih xv ih high z reset xxx v il xhigh z product identification hardware v il v il v ih a1 - a16 = v il , a9 = v h , (3) a0 = v il manufacturer code (4) a1 - a16 = v il , a9 = v h, (3) a0 = v ih device code (4) software (5) a0 = v il , a1 - a16 =v il manufacturer code (4) a0 = v ih , a1 - a16 =v il device code (4) 9. dc characteristics symbol parameter condition min max units i li input load current v in = 0v to v cc 10 a i lo output leakage current v i/o = 0v to v cc 10 a i sb1 v cc standby current cmos ce = v cc - 0.3v to v cc 50 a i sb2 v cc standby current ttl ce = 2.0v to v cc 1ma i cc (1) v cc active current f = 5 mhz; i out = 0 ma 30 ma v il input low voltage 0.8 v v ih input high voltage 2.0 v v ol output low voltage i ol = 2.1 ma 0.45 v v oh1 output high voltage i oh = -400 a 2.4 v v oh2 output high voltage cmos i oh = -100 a; v cc = 4.5v 4.2 v
8 3365e?flash?4/05 at49f001a(n)(t) 11. ac read waveforms (1)(2)(3)(4) notes: 1. ce may be delayed up to t acc - t ce after the address transition without impact on t acc . 2. oe may be delayed up to t ce - t oe after the falling edge of ce without impact on t ce or by t acc - t oe after an address change without impact on t acc . 3. t df is specified from oe or ce whichever occurs first (cl = 5 pf). 4. this parameter is characterized and is not 100% tested. 10. ac read characteristics symbol parameter at49f001a(n)(t)-45 at49f001a(n)(t)-55 units min max min max t acc address to output delay 45 55 ns t ce (1) ce to output delay 45 55 ns t oe (2) oe to output delay 0 30 0 30 ns t df (3)(4) ce or oe to output float 0 25 0 25 ns t oh output hold from oe , ce or address, whichever occurred first 00ns address output high z output oe ce t acc t oe t df t oh t ce valid address valid
9 3365e?flash?4/05 at49f001a(n)(t) 12. input test waveform and measurement level t r , t f < 5 ns 13. output load test note: 1. this parameter is characterized and is not 100% tested. 5.0v 1.8k 30 pf output pin 1.3k 14. pin capacitance f = 1 mhz, t = 25c (1) symbol typ max units conditions c in 46pfv in = 0v c out 812pfv out = 0v
10 3365e?flash?4/05 at49f001a(n)(t) 16. ac byte load waveforms 16.1 we controlled 16.2 ce controlled 15. ac byte load characteristics symbol parameter min max units t as , t oes address, oe set-up time 0 ns t ah address hold time 25 ns t cs chip select set-up time 0 ns t ch chip select hold time 0 ns t wp write pulse width (we or ce )20ns t ds data set-up time 20 ns t dh , t oeh data, oe hold time 0 ns t wph write pulse width high 20 ns t dh t ds t as t ah t wp ce address data in oe t oes t oeh we t cs t ch t wph t dh t ds t as t ah t wp we address data in oe t oes t oeh ce t cs t ch t wph
11 3365e?flash?4/05 at49f001a(n)(t) 18. program cycle waveforms 19. sector or chip erase cycle waveforms notes: 1. oe must be high only when we and ce are both low. 2. for chip erase, the address should be 555. for sector erase, the address depends on what sector is to be erased. (see note 4 under ?command definition table? on page 6 .) 3. for chip erase, the data should be 10h, and for sector erase, the data should be 30h. 17. program cycle characteristics symbol parameter min typ max units t bp byte programming time 30 50 s t as address set-up time 0 ns t ah address hold time 25 ns t ds data set-up time 20 ns t dh data hold time 0 ns t wp write pulse width 20 ns t wph write pulse width high 20 ns t ec erase cycle time 3 5 seconds 6 6
12 3365e?flash?4/05 at49f001a(n)(t) notes: 1. these parameters are characterized and not 100% tested. 2. see t oe spec in ?ac read characteristics? . 21. data polling waveforms notes: 1. these parameters are characterized and not 100% tested. 2. see t oe spec in ?ac read characteristics? . 23. toggle bit waveforms (1)(2)(3) notes: 1. toggling either oe or ce or both oe and ce will operate toggle bit. the t oehp specification must be met by the toggling input(s). 2. beginning and ending state of i/o6 will vary. 3. any address location may be used but the address should not vary. 20. data polling characteristics (1) symbol parameter min typ max units t dh data hold time 10 ns t oeh oe hold time 10 ns t oe oe to output delay (2) ns t wr write recovery time 0 ns high z an an an an an we ce oe i/o7 a0-a16 t oeh t oe t dh t wr 22. toggle bit characteristics (1) symbol parameter min typ max units t dh data hold time 10 ns t oeh oe hold time 10 ns t oe oe to output delay (2) ns t oehp oe high pulse 50 ns t wr write recovery time 0 ns we ce oe i/o6 t oeh high z t dh t oe t wr t oehp
13 3365e?flash?4/05 at49f001a(n)(t) 24. software product identification entry (1) 25. software product identification exit (1) notes: 1. data format: i/o7 - i/o0 (hex); address format: a14 - a0 (hex). 2. a1 - a16 = v il . manufacture code is read for a0 = v il ; device code is read for a0 = v ih . additional device code is read for address 0003h 3. the device does not remain in identification mode if powered down. 4. the device returns to standard operation mode. 5. manufacturer code: 1fh device code: 05h ? at49f001a(n), 04h ? at49f001a(n)t additional device code: 0fh ? at49f001a(n)(t). load data aa to address 555 load data 55 to address aaa load data 90 to address 555 enter product identification mode (2)(3)(5) load data aa to address 555 load data 55 to address aaa load data f0 to address 555 exit product identification mode (4) or load data f0 to any address exit product identification mode (4) 26. boot block lockout feature enable algorithm (1) notes: 1. data format: i/o7 - i/o0 (hex); address format: a14 - a0 (hex). 2. boot block lockout feature enabled. load data aa to address 555 load data 55 to address aaa load data 80 to address 555 load data aa to address 555 load data 55 to address aaa load data 40 to address 555 pause 1 second (2)
14 3365e?flash?4/05 at49f001a(n)(t) 27. ordering information 27.1 standard package t acc (ns) i cc (ma) ordering code package operation range active standby 45 30 0.05 at49f001a-45ji at49f001a-45ti at49f001a-45vi 32j 32t 32v industrial (-40 to 85 c) at49f001an-45ji at49f001an-45ti at49f001an-45vi 32j 32t 32v industrial (-40 to 85 c) at 4 9 f 0 0 1 at- 4 5 j i at 4 9 f 0 0 1 at- 4 5 t i at 4 9 f 0 0 1 at- 4 5 v i 32j 32t 32v industrial (-40 to 85 c) at49f001ant-45ji at49f001ant-45ti at49f001ant-45vi 32j 32t 32v industrial (-40 to 85 c) 55 30 0.05 at49f001a-55ji at49f001a-55ti at49f001a-55vi 32j 32t 32v industrial (-40 to 85 c) at49f001an-55ji at49f001an-55ti at49f001an-55vi 32j 32t 32v industrial (-40 to 85 c) at 4 9 f 0 0 1 at- 5 5 j i at 4 9 f 0 0 1 at- 5 5 t i at 4 9 f 0 0 1 at- 5 5 v i 32j 32t 32v industrial (-40 to 85 c) at49f001ant-55ji at49f001ant-55ti at49f001ant-55vi 32j 32t 32v industrial (-40 to 85 c) 27.2 green package option (pb/halide-free) t acc (ns) i cc (ma) ordering code package operation range active standby 55 30 0.05 at49f001an-55ju at49f001an-55tu at49f001an-55vu 32j 32t 32v industrial (-40 to 85 c) at49f001ant-55ju at49f001ant-55tu at49f001ant-55vu 32j 32t 32v industrial (-40 to 85 c) package type 32j 32-lead, plastic j-leaded chip carrier package (plcc) 32t 32-lead, plastic thin small outline package (tsop) (8 x 20 mm) 32v 32-lead, plastic thin small outline package (vsop) (8 x 14 mm)
15 3365e?flash?4/05 at49f001a(n)(t) 28. packaging information 28.1 32j ? plcc drawing no. rev. 2325 orchard parkway san jose, ca 95131 r title 32j , 32-lead, plastic j-leaded chip carrier (plcc) b 32j 10/04/01 1.14(0.045) x 45? pin no. 1 identifier 1.14(0.045) x 45? 0.51(0.020)max 0.318(0.0125) 0.191(0.0075) a2 45? max (3x) a a1 b1 e2 b e e1 e d1 d d2 common dimensions (unit of measure = mm) symbol min nom max note notes: 1. this package conforms to jedec reference ms-016, variation ae. 2. dimensions d1 and e1 do not include mold protrusion. allowable protrusion is .010"(0.254 mm) per side. dimension d1 and e1 include mold mismatch and are measured at the extreme material condition at the upper or lower parting line. 3. lead coplanarity is 0.004" (0.102 mm) maximum. a 3.175 ? 3.556 a1 1.524 ? 2.413 a2 0.381 ? ? d 12.319 ? 12.573 d1 11.354 ? 11.506 note 2 d2 9.906 ? 10.922 e 14.859 ? 15.113 e1 13.894 ? 14.046 note 2 e2 12.471 ? 13.487 b 0.660 ? 0.813 b1 0.330 ? 0.533 e 1.270 typ
16 3365e?flash?4/05 at49f001a(n)(t) 28.2 32t ? tsop 2325 orchard parkway san jose, ca 95131 title drawing no. r rev. 32t , 32-lead (8 x 20 mm package) plastic thin small outline package, type i (tsop) b 32t 10/18/01 pin 1 d1 d pin 1 identifier b e e a a1 a2 0o ~ 8o c l gage plane seating plane l1 common dimensions (unit of measure = mm) symbol min nom max note notes: 1. this package conforms to jedec reference mo-142, variation bd. 2. dimensions d1 and e do not include mold protrusion. allowable protrusion on e is 0.15 mm per side and on d1 is 0.25 mm per side. 3. lead coplanarity is 0.10 mm maximum. a ? ? 1.20 a1 0.05 ? 0.15 a2 0.95 1.00 1.05 d 19.80 20.00 20.20 d1 18.30 18.40 18.50 note 2 e 7.90 8.00 8.10 note 2 l 0.50 0.60 0.70 l1 0.25 basic b 0.17 0.22 0.27 c 0.10 ? 0.21 e 0.50 basic
17 3365e?flash?4/05 at49f001a(n)(t) 28.3 32v ? vsop 2325 orchard parkway san jose, ca 95131 title drawing no. r rev. 32v , 32-lead (8 x 14 mm package) plastic thin small outline package, type i (vsop) b 32v 10/18/01 pin 1 d1 d pin 1 identifier b e e a a1 a2 0o ~ 8o c l gage plane seating plane l1 common dimensions (unit of measure = mm) symbol min nom max note notes: 1. this package conforms to jedec reference mo-142, variation ba. 2. dimensions d1 and e do not include mold protrusion. allowable protrusion on e is 0.15 mm per side and on d1 is 0.25 mm per side. 3. lead coplanarity is 0.10 mm maximum. a ? ? 1.20 a1 0.05 ? 0.15 a2 0.95 1.00 1.05 d 13.80 14.00 14.20 d1 12.30 12.40 12.50 note 2 e 7.90 8.00 8.10 note 2 l 0.50 0.60 0.70 l1 0.25 basic b 0.17 0.22 0.27 c 0.10 ? 0.21 e 0.50 basic
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